IntelliSuite9.0 technical parameters
- Categories:Software case
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- Time of issue:2022-06-28
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IntelliSuite9.0 technical parameters
(Summary description)
- Categories:Software case
- Author:
- Origin:
- Time of issue:2022-06-28
- Views:382
The MEMS design software IntelliSuite provided by our company is a professional software tool for MEMS (Micro Electro Mechanical System), micro-nano field design, simulation and analysis. Process level, system level analysis. Can use finite element, boundary element and other methods to analyze microstructure and multi-physical quantity (field) coupling analysis, including mechanical properties, force, deformation, thermal properties, temperature stress, thermoelectric effect, current, voltage, piezoelectricity, pressure Static, dynamic, frequency, damping, steady-state and transient analysis of resistive, electromagnetic, microfluidic and other phenomena.
1. IntelliFab
Combined with materials, layout and process flow, it can be exported to the FabSim module to create a 3D virtual model of the device, and exported to the TEM module for analysis.
- Complete MEMS process flow including deposition, etching, bonding, doping and electroplating. Users can add their own crafts;
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Support standard tape-out process, such as MUMPS, SCREAM, SUMMIT, Bosch Surface Micromachining, LIGA, etc. Users can create their own process templates;
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Support II-V compound semiconductor process;
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Support composite layout lithography process;
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Support SOl material, support the synchronization of resistivity and sheet resistance parameters, support automatic estimation of SiO2 parameters;
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Wet etch rate editing capabilities for patterned silicon and quartz;
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Support the output of Excel format process flow sheet;
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Combined with FabSim to simulate the three-dimensional model of the device after any process step;
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Combined with TEM analysis of the impact on the device, more accurate multiphysics simulations can be achieved;
2. FabViewer
Powerful process demonstration tool based on 3D voxel manipulation.
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Display the technological process in the form of animation;
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3D model of the device after simulating any process step;
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Supports most MEMS process simulations, including: isotropic/anisotropic deposition, isotropic/anisotropic etching, wet etching, bonding, photolithography, and oxidation/implantation in CMOS processes;
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Using voxel graphics technology, more realistic demonstration of three-dimensional complex device structure;
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Using volume rendering technology, users can view the internal information of the device through functions such as rotation, translation, zoom, and section;
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Use geometric algorithms to simulate deposition and etching processes more realistically;
3.FabSim
Accurate 3D process physics simulation tool.
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Adopt high-precision physical simulation algorithm to support MEMS and IC processes such as deposition, lithography, etching, and oxide implantation, which is closer to the real process;
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Support high precision mode and fast mode emulation, while providing GPU acceleration function;
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Deep reactive particle etching algorithm based on high precision diffusion equation;
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Wet anisotropic etching algorithm based on high-precision LevelSet, supports a variety of materials, and has strong scalability;
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Supports physical simulation of various compound semiconductor processes such as IVV semiconductors (InP);
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Support spray quasi-isotropic wet etching process;
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3D voxel graphic display technology, support layered display according to the process, easy to observe the internal structure information of the device;
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Support mesh export, which can be seamlessly connected with the analysis module;
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Support PPT, AVI, JPG, rawiv and other formats output;
4. IntelliEtch
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Accurate wet etching process simulation based on atomic model;
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Integrated DRIE and multiple mask compounding process functions;
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Cellular automata and dynamic Monte Carlo model based on octree and parallel computing;
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Complete etching process database, user-oriented open interface;
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Arbitrary high-index crystal planes can be defined and cut;
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Accurate description of corrosion surface topography;
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Compatible with IntelliMask layout files and Bmp mask files;
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Output FEM grid data;
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ItelliEtchG based on GPU massively parallel computing;
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Wagon Wheel Analyzer silicon etch rate extraction tool;
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Etch Rate Visualizer / CCA calibrator Silicon etch rate visualization and calibration tool;
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Wagon Wheel Analyzer II Quartz Etch Rate Extraction Tool;
5. AnisE
The advanced, automatic control-based unit etching simulation technology can obtain accurate <100>.<110> single crystal silicon wafer KOH and TMAH anisotropic etching simulation results, and can also be used for complex layout and long-term etching.
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Top, bottom and double-sided etching of wafers;
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Multiple cutoff layers and multiple etchings of different masks on a single wafer;
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Reflect the effects of misaligned masks, and compensation techniques;
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Predict the effect of etchant temperature, concentration and etching time on device shape;
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TMAH and KOH etching rate database, users can also customize the etching rate;
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Determine the effect of vertical etching in the case of coupled anisotropic etching;
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3D graphics and cross-section visualization;
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Measure the distance and angle between any two points of the wafer after etching;
6. RECIPE
Simulate the RIE/ICP (Bosch Process) process to clearly reflect how the processing process affects the product molding.
Adjustable side scallops, roughness and period;
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The lag effect of RIE and DRIE;
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Simulate the final solid shape and side angle;
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Consider mask effects;
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Create structures with adjustable process parameters for specific sections;
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Support Footing effect simulation;
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Support process parameter calculation;
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DRIE etching rate and aspect ratio calibration tool;
7. Exposure
Simulate the MEMS thick-resist physical lithography process, and use the physical simulation algorithm and physical model to accurately reflect the SU8 and other thick-resist lithography effects.
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Support the four-step simulation of image forming, exposure, post-baking, and development;
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Detailed pre- and post-exposure lighting models;
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Support multi-layer mask file layout settings;
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Support fine measurement of 3D display results;
8. MEMaterial
The most comprehensive thin-film material database and process optimization tool available today, providing important links between process parameters and device characteristics.
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Contains as many as 70 kinds of common film material properties of MEMS based on real process, making the simulation results more accurate;
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Allow users to add and customize materials;
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Export material properties directly to the TEM analysis module via the InteliFab module;
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Process Optimization;
9. Blueprint
A design tool dedicated to editing MEMS layouts.
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Multi-layer layout editing function;
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Boolean operations can be performed on the layout;
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A perfect combination of shape and topology;
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Automatically generate the optimal device structure layout;
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Can read files in BMP, JPG, PNG and other image formats; .
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It can automatically generate a series of new units to the specified layer through the existing layer according to certain rules;
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Automatically simplify and cut polygons with too many vertices;
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Ability to draw complex layouts such as ellipses, arcs, irregular curved edges and sinusoids;
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Parameter script editing function: changing device parameters can quickly and easily modify the device structure, greatly shortening the design time;
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Layout script database of various common MEMS devices, including various MEMS sensors, actuators, packaging, testing and pressure devices;
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Modify or create new parameter scripts;
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Create complex layouts using cell-based VBS scripts;
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Complete GDSII file conversion function;
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Compatible with industry mainstream file formats GDSI, MSK, DXF;
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Support DESIGN RULE CHECK;
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Supports various Boolean operations on the layout, which can easily create complex structures;.
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Fully support CELL layered structure;
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Process preview of 3D structures;
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Provide Measurement and Dimensioning Tools, which can easily mark the layout;
10. 3D Builder
A powerful tool for interactive editing of 3D models of devices.
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Cartesian and polar grid points to assist in creating the optimal model of the device;
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Snap to grid or snap to points (including midpoints, intersections and split points, etc.);
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Input layout (GDS, DXF or VEC format) to optimize the model;
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Mesh subdivision for specified parts, such as spider web, zipper, and divergence;
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Compatible with ANSYS, ABAQUS, PATRAN, I-DEAS formats;
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Able to solve large-scale matrices; .
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Easily modify structural thickness and clearance;
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Automatic verification of mesh quality and correctness;
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The model is directly generated from the 2D layout and divided into hexahedral meshes;
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Automatically correct disconnected meshes (when the number of meshes is small);
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Build sloped meshes;
11. ThermoElectroMechanical (TEM)
It can perform thermal, electrostatic, mechanical, thermo-mechanical-electrical coupling, fluid-structure coupling analysis in different types of static, dynamic, transient and frequency domains.
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Define the stress gradient and add the Coriolis force to the cyclotron;
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Changed FEA questions, unique EFM features;
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Finite element and boundary element solvers;
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High-precision electrostatic drive model;
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Compatible with ANSYS, PATRAN, IDEAS;
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Use the IneliFab module to generate finite element models or use 3DBuilder to generate 3D models of components;
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Take into account the relationship between thermal conductivity, resistivity, thermal expansion coefficient, density and temperature;
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Contact analysis, piezoelectric, piezoresistive and packaging analysis;
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Accurate dynamic analysis of electromechanical coupling to realize dynamic electromechanical coupling simulation based on real 3D device structure;
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The extended piezoelectric analysis function, which includes the charge density in addition to the voltage load, can study the open-circuit performance of the piezoelectric structure,
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FBAR/SAW/BAW designers can quickly calculate serial and parallel resonances through this module, and then calculate the coupling factor;
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Piezoelectric transient and dynamic simulation includes transient voltage differential input, transient charge density input and the influence of SqueezeFilm;
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Eigenfrequency analysis of specified modes;
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The complete finite element model can be obtained by a reduction method - a simplified model which can be used for system level analysis.
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This reduction method is based on Arnoldi reduction method, Lagrangian mechanics and mode superposition;
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Macro model feature extraction, automatic generation of system models with N degrees of freedom. Complete recording of nonlinear dynamic behavior, including harmonic and sub-harmonic responses;
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Create rigid-body models for electronics, or higher-order models that include second-order effects (parasitics, nonlinear deformation, temperature effects, and encapsulation effects) for designing compensated electrical components;
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Provide 32- and 64-bit solvers, support SMP multi-core parallel computing; .
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Static calculation of thermoelectromotive force Seebeck effect;
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Static, frequency and dynamic analysis and calculation of magnetostrictive effect;
12. ParameterAnalysis
Customizable parametric analysis tools, from layout generation, 3D model mesh establishment, boundary and load settings, to analysis and post-processing, to generate analysis reports.
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Unattended parametric analysis;
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size parameterization;
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Load parameterization;
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Standard cell layout library;
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Customizable units and layouts;
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One-click 3D mesh creation;
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Automatic boundary and load addition;
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The final result report, which can extract the results under any specified parameters;
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A comparison chart of the results under different parameters can be generated;
13. Microfluidic
for analyzing microfluidics and microscopic phenomena in the field of BioMEMS.
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microchannel flow;
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Electrically driven flow (electroosmosis, electrophoresis);
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Dielectrophoresis (two-dimensional electrophoresis);
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Ion-driven flow in an electric field;
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Electrowetting (Electric Field Droplet Surface Tension Driven Simulation), Free Surface Flow;
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Define sliding boundary conditions to simulate plug flow;
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The mixing and separation flow of acid, alkali and weak electrolyte under the action of electric field;
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Convective heat transfer effect;
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Using block-fitted coordinates, it can accurately describe complex geometric models and solve the problem of moving boundaries;
14. EMag Analysis
Three-dimensional full-wave electromagnetic field analysis module.
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MEMS accurate full wave analysis;
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Real deformation structure analysis;
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Adopt the internationally popular finite element analysis solver;
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Precise boundary condition settings;
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Automatic air filling; .
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Powerful adaptive tetrahedral partitioning;
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Rich electromagnetic material library;
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Multiple matrix equation solvers to choose from, including CG and GMRES;
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Support multi-core parallel computing; .
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Extraction of S-parameters;
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Extraction of impedance matrix;
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Three-dimensional display of electric and magnetic fields;
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Smith chart;
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Support other relevant industrial formats (such as ACIS text format);
- The data format is compatible with other modules of InelliSuite;
15. SYNPLE
It is a multi-field, multi-scale MEMS and nanotechnology system-level design tool, which is an epoch-making product for effective comprehensive design of devices and circuits. Combined with other modules of InelliSuite, many technical problems in industry can be solved.
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A good extensibility framework, which can easily add new units;
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A flexible way of defining units without learning a new language;
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No need to spend a lot of time to calculate the Jacobian determinant, the calculation speed is significantly better than traditional numerical methods;
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Pre-built cell libraries include analog, digital, hybrid digital-analog, mechanical, and MEMS components. and is constantly being updated;
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The innovative SME (System Model Extraction) can systematically analyze the dynamic characteristics of MEMS devices, extract device characteristic parameters, and convert - a large FEA model into - an accurate N-degree-of-freedom energy model, which can be imported into the SYNPLE module for simulation , and finally obtain results consistent with the full FEA analysis, while the calculation speed is increased by 1000 times;
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mEFM (Multiple Surface Meshing) specially developed for inertial devices such as MEMS gyroscopes and accelerometers
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The algorithm can efficiently and accurately analyze the characteristic parameters of complex comb tooth structure, which greatly improves the operation efficiency;
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Based on the Jiles-Atherton model and the secondary domain rotation model, considering the hysteresis effect of the changing magnetic field, a MEMS unit with magneto-mechanical coupling and magneto-piezoelectric coupling is developed;
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